| PART |
Description |
Maker |
| 50PA-411 |
LC HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
| 50PA-560 |
HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
| 4400-094 4400-094LF |
Electrical Testing per Tusonix standard test plans and Mil-Std-202 Test Methods
|
List of Unclassifed Manufacturers
|
| 0040.1061 0040.1062 0040.1141 0040.1142 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 4082A |
Parametric Test System
|
Keysight Technologies
|
| 50PMA-019 |
TRANSCEIVER TEST SYSTEM
|
JFW Industries, Inc.
|
| 6245-48-0 6245-48-2 |
Test Clip to Straight Sheathed Banana Plug
Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
|
Pomona Electronics
|
| DK-21169 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
| 6470 |
Test Probe; Leaded Process Compatible:Yes; Peak Reflow Compatible (260 C):Yes RoHS Compliant: Yes INTERCONNECTION DEVICE
SMD Microtip Test Probe Set
|
Pomona Electronics
|
| AP160L AP160 |
8-BIT MICROCONTROLLER WITH 8KB OTP
ECONOLINE: REC3-S_DRW(Z)/H4,H6 - Safety standards and approval: EN 60950 certified, rated for 250VAV (LVD test report)- Applied for Ul 1950 Component
Zener Diode; Zener Voltage Typ, Vz:5.1V; Vz Test Current, Izt:20mA; Power Dissipation, Pd:500mW; Package/Case:41-MiniDIP; Leaded Process Compatible
|
AMIC Technology Corporation
|
| 5951A |
Test Probe Set; Connector Type A:Replaceable-Tip Probe (1 Black/1 Red); Connector Type B:Right-Angle Banana Plug; Cable Length:4ft; Current Rating:5A; Features:2 Stainless Steel Sharp Replaceable Probe Tips RoHS Compliant: NA INTERCONNECTION DEVICE
Test Probe Set Replaceable Tip
|
Pomona Electronics
|
